Secondary ion mass spectrometry SIMS XIII - Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Nara, Japan, November 11-16, 2001 - Preface

被引：0

|

作者：

Nihei, Y ^{[1
]}

机构：

[1] Sci Univ Tokyo, Fac Sci & Technol, Noda, Chiba 2788510, Japan

来源：

APPLIED SURFACE SCIENCE | 2003年 / 203卷

关键词：

D O I：

10.1016/S0169-4332(02)00945-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：3 / 4

页数：2

相关论文

共 5 条

[1] SECONDARY ION MASS SPECTROMETRY SIMS XIII - Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Nara, Japan, November 11-16, 2001 - Foreword
Benninghoven, A
APPLIED SURFACE SCIENCE, 2003, 203 : 1 - 2
[2] Proceedings of the Sixteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVI Preface
Kudo, Masahiro
Oiwa, Retsu
Yurimoto, Hisayashi
APPLIED SURFACE SCIENCE, 2008, 255 (04) : 803 - 804
[3] Secondary ion mass spectrometry SIMS XV - Proceedings of the Fifteenth International Conference on Secondary Ion Mass Spectrometry (SIMS XV) - The University of Manchester, UK September 12-16, 2005 - Preface
Vickerman, John
Gilmore, Ian
APPLIED SURFACE SCIENCE, 2006, 252 (19) : XIX - XX
[4] Special Issue - Secondary Ion Mass Spectrometry SIMS XIV - Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics - San Diego, California, USA, September 14-19, 2003 - Preface
Hunter, J
Schueler, BW
Stevie, FA
APPLIED SURFACE SCIENCE, 2004, 231 : 1 - 2
[5] PROCEEDINGS OF THE ANRT-GROUP ANALYSEUR-IONIQUE, PARIS, OCTOBER 1979 - REPORT ON THE 2ND INTERNATIONAL SECONDARY ION MASS-SPECTROMETRY (SIMS) CONFERENCE, STANFORD, 26-31 AUGUST 1979 - SURVEY IN THE SEMICONDUCTORS FIELDS
HUBER, AM
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1980, 5 (02): : 207 - 214