Revealing the beneficial role of K in grain interiors, grain boundaries, and at the buffer interface for highly efficient CuInSe2 solar cells

被引:19
|
作者
Muzzillo, Christopher P. [1 ,3 ]
Poplawsky, Jonathan D. [2 ]
Tong, Ho Ming [3 ]
Guo, Wei [2 ]
Anderson, Tim [3 ]
机构
[1] Natl Renewable Energy Lab, 15013 Denver West Pkwy, Golden, CO 80401 USA
[2] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, POB 2008, Oak Ridge, TN 37831 USA
[3] Univ Florida, Dept Chem Engn, 1030 Ctr Dr, Gainesville, FL 32611 USA
来源
PROGRESS IN PHOTOVOLTAICS | 2018年 / 26卷 / 10期
关键词
atom probe tomography; chalcopyrite; Cu(In; Ga)Se-2; CuInSe2; electron beam-induced current; potassium; CU(IN; GA)SE-2; THIN-FILMS; POSTDEPOSITION TREATMENT; POTASSIUM; SURFACE; PERFORMANCE; ABSORBERS; ELEMENTS; NA;
D O I
10.1002/pip.3022
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
K incorporation within grain boundaries, grain interiors, and interfaces has been studied within CuInSe2 solar cells to better understand the beneficial or detrimental role of K distribution among these regions in chalcopyrite-based solar cells. Solar cells have been fabricated with intentional K introduction into specific regions of the device including the CuInSe2/CdS interface (CuInSe2/KInSe2/CdS) and the grain interiors (Cu0.93K0.07InSe2/CdS). A control CuInSe2/CdS device was also studied to separate effects of K originating from the soda-lime glass substrate from those of intentionally introduced K. The experiment was designed to understand K effects in Cu(In,Ga)Se-2 solar cells while mitigating complications from multiple elements in the 3(+) site. The distribution of all elements within these samples has been directly observed with sub-nm resolution via atom probe tomography. In addition, electron beam-induced current measurements have been performed to correlate the atom probe tomography compositional profiles to the nanoscale carrier collection properties. The experiments show that a large decrease in the Cu/In ratio at the CdS interface can be achieved by forming KInSe2 at the absorber surface, which drastically improves the device efficiency. The results presented here show a direct link between K concentration, Cu depletion, and In accumulation, such that the Cu/In ratio significantly reduces with K incorporation. The findings help clarify the mechanism behind K-induced efficiency enhancement.
引用
收藏
页码:825 / 834
页数:10
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