Direct and inverse problems in x-ray three-crystal triple Laue case interferometry

被引:3
|
作者
Fodchuk, I. M. [1 ]
Novikov, S. M. [1 ]
Yaremchuk, I. V. [1 ]
机构
[1] Chernivtsi Natl Univ, Kotsjubynskyi Str 2, Chernovtsy, Ukraine
关键词
DYNAMICAL THEORY; DIFFRACTION;
D O I
10.1364/AO.55.00B120
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We study the mechanisms of forming x-ray moire images arising under the action of one-dimensional rows of local concentrated forces at the output surface of a triple-crystalline triple Laue case interferometer for the cases of their orientation parallel and perpendicular to the vector of diffraction. The presence of constant phase shift of one of the interfering waves in the interferometer's analyzer results in the diminishing of period, contrast, and area of deformation moire fringes. It is shown that the area of efficient interaction of phase and deformation moires depends on both the magnitude of the constant phase shift and the magnitude and character of arrangement of local concentrated forces in rows. (C) 2016 Optical Society of America
引用
收藏
页码:B120 / B125
页数:6
相关论文
共 50 条
  • [1] X-Ray Three-Crystal Interferometer with Manual Control
    Drmeyan, H. R.
    Trouni, K. G.
    Muradyan, T. R.
    Shahverdyan, A. V.
    JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES, 2023, 58 (02) : 193 - 197
  • [2] X-Ray Three-Crystal Interferometer with Manual Control
    H. R. Drmeyan
    K. G. Trouni
    T. R. Muradyan
    A. V. Shahverdyan
    Journal of Contemporary Physics (Armenian Academy of Sciences), 2023, 58 : 193 - 197
  • [3] Crystal bending in triple-Laue X-ray interferometry. Part I. Theory
    Sasso C.P.
    Mana G.
    Massa E.
    Journal of Applied Crystallography, 2023, 56 (03) : 707 - 718
  • [4] Crystal bending in triple-Laue X-ray interferometry. Part I. Theory
    Sasso, C. P.
    Mana, G.
    Massa, E.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2023, 56 : 707 - 715
  • [5] New method for measuring crystal curvature on a three-crystal X-ray diffractometer
    Mal'tsev, YF
    Garkushev, EN
    Nikiforov, IY
    CRYSTALLOGRAPHY REPORTS, 1998, 43 (02) : 326 - 326
  • [7] Defocused travelling fringes in a scanning triple-Laue X-ray interferometry setup
    Sasso, C. P.
    Mana, G.
    Massa, E.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021, 54 (05) : 1403 - 1408
  • [8] Three-crystal x-ray diffractometry for ion implanted layers analysis (a review)
    Shcherbachev, K.D.
    Kuripyatnik, A.V.
    Bublik, V.T.
    Zavodskaya Laboratoriya. Diagnostika Materialov, 2003, 69 (06): : 23 - 32
  • [9] Short x-ray pulses in a Laue-case crystal
    Graeff, W
    JOURNAL OF SYNCHROTRON RADIATION, 2002, 9 : 82 - 85
  • [10] THREE-CRYSTAL X-RAY SPECTROMETER FOR THE INVESTIGATION OF THE STRUCTURAL PERFECTION OF REAL CRYSTALS.
    Koval'chuk, M.V.
    Kov'ev, E.K.
    Kozelikhin, Yu.M.
    Mirenskii, A.V.
    Shilin, Yu.N.
    1600, (19):