Monte Carlo simulation for radiographic applications.

被引:0
|
作者
Tillack, GN [1 ]
Bellon, C
机构
[1] BAM, Bereich Zerstorungsfreien Prufung, Berlin, Germany
[2] BAM, Durchstrahlungsprufung, Bebiet Comp Simulat, Berlin, Germany
来源
MATERIALPRUFUNG | 2003年 / 45卷 / 03期
关键词
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Standard radiography simulators are based on the attenuation law complemented by built-up-factors (BUF) to describe the interaction of radiation with material. The assumption of BUF implies that scattered radiation reduces only the contrast in radiographic images. This simplification holds for a wide range of applications like weld inspection as known from practical experience. But only a detailed description of the different underlying interaction mechanisms is capable to explain effects like mottling or others that every radiographer has experienced in practice. The application of Monte Carlo models is capable to handle primary and secondary interaction mechanisms contributing to the image formation process like photon interactions (absorption, incoherent and coherent scattering including electron-binding effects, pair production) and electron interactions (electron tracing including X-Ray fluorescence and Bremsstrahlung production). It opens up possibilities like the separation of influencing factors and the understanding of the functioning of intensifying screen used in film radiography. The paper discusses the opportunities in applying the Monte Carlo method to investigate special features in radiography in terms of selected examples.
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页码:85 / 91
页数:7
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