Imaging plates calibration to X-rays

被引：9

作者：

Curcio, A. ^{[1
]}

Andreoli, P. ^{[2
]}

Cipriani, M. ^{[2
]}

Claps, G. ^{[2
]}

Consoli, F. ^{[2
]}

Cristofari, G. ^{[2
]}

De Angelis, R. ^{[2
]}

Giulietti, D. ^{[3
,4
]}

Ingenito, F. ^{[2
]}

Pacella, D. ^{[2
]}

机构：

[1] Univ Roma La Sapienza, Dept Phys, Ple A Moro 5, I-00185 Rome, Italy

[2] ENEA EUROfus, Via E Fermi 45, I-00044 Rome, Italy

[3] Univ Pisa, Dept Phys, Largo Bruno Pontecorvo 3, I-56127 Pisa, Italy

[4] Ist Nazl Fis Nucl, Largo Bruno Pontecorvo 3, I-56127 Pisa, Italy

来源：

JOURNAL OF INSTRUMENTATION | 2016年 / 11卷

关键词：

Solid state detectors; X-ray detectors; X-ray fluorescence (XRF) systems; X-ray generators and sources;

D O I：

10.1088/1748-0221/11/05/C05011

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The growing interest for the Imaging Plates, due to their high sensitivity range and versatility, has induced, in the last years, to detailed characterizations of their response function in different energy ranges and kind of radiation/particles. A calibration of the Imaging Plates BAS-MS, BAS-SR, BAS-TR has been performed at the ENEA-Frascati labs by exploiting the X-ray fluorescence of different targets (Ca, Cu, Pb, Mo, I, Ta) and the radioactivity of a BaCs source, in order to cover the X-ray range between few keV to 80 keV.

引用

页数：15

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