Investigation of thermal resistive probe behaviour used in Scanning Thermal Microscope by infrared imaging system

A new approach to estimate heat fluxes lost by the thermal-resistive probe of SThM has been used. This approach is based on an experimental set-up with infrared thermography measurement system coupled with an infrared transparent material. The measurements allow us to obtain experimental temperature profiles along the probe but also, experimental temperature profiles of samples in contact with the thermal probe. A modeling combined with these experimental results allows to estimate heat fluxes participating in the thermal balance of the probe and to define the operating temperature range to use the SThM with a higher sensitivity.