Grain size characterization in metallic alloys using different microscopy and post-processing techniques

被引:15
|
作者
Flipon, B. [1 ]
Grand, V [1 ,2 ]
Murgas, B. [1 ]
Gaillac, A. [2 ]
Nicolay, A. [1 ]
Bozzolo, N. [1 ]
Bernacki, M. [1 ]
机构
[1] PSL Res Univ, Mines ParisTech, CNRS, CEMEF,UMR 7635, F-06904 Sophia Antipolis, France
[2] Framatome Res Ctr Zr Components, F-73400 Ugine, France
关键词
Mean grain size; Grain size distribution; Optical microscopy; Scanning electron microscopy; BackScattered electron; Electron BackScattered Diffraction; Image analysis; ORIENTATION;
D O I
10.1016/j.matchar.2021.110977
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this work, an image analysis procedure which enables an estimation of grain size distribution from optical and scanning electron micrographs is detailed. Two applicative cases (a face centered cubic austenitic stainless steel and a hexagonal close packed zirconium alloy, both with fully recrystallized equiaxed microstructure) are considered. Grain size definition is discussed both in terms of mean grain size and of grain size distribution. Classical methodologies as well as standardized definitions are recalled and compared to each other. Results obtained by electron backscattered diffraction analysis are compared to the ones obtained after image analysis based on backscattered electron or optical micrographs. The effect of data processing parameters on grain size results is also examined. Image analysis based on optical or scanning electron micrographs proves to be suitable to obtain accurate grain size distribution information with shorter acquisition and processing times compared to EBSD orientation mapping of the same analyzed area.
引用
收藏
页数:14
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