Atomic force microscopy as a tool for atom manipulation

被引:7
|
作者
Custance, Oscar [1 ]
Perez, Ruben [2 ]
Morita, Seizo [3 ]
机构
[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan
[2] Univ Autonoma Madrid, Dept Fis Teor Mat Condensada, E-28049 Madrid, Spain
[3] Osaka Univ, Grad Sch Engn, Suita, Osaka 5650871, Japan
关键词
SCANNING TUNNELING MICROSCOPE; QUARTZ TUNING FORK; SINGLE-MOLECULE; LATERAL MANIPULATION; FREQUENCY-SHIFTS; QUANTUM CORRALS; BOND FORMATION; SIZE DEFECTS; CHARGE-STATE; SURFACE;
D O I
10.1038/NNANO.2009.347
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
During the past 20 years, the manipulation of atoms and molecules at surfaces has allowed the construction and characterization of model systems that could, potentially, act as building blocks for future nanoscale devices. The majority of these experiments were performed with scanning tunnelling microscopy at cryogenic temperatures. Recently, it has been shown that another scanning probe technique, the atomic force microscope, is capable of positioning single atoms even at room temperature. Here, we review progress in the manipulation of atoms and molecules with the atomic force microscope, and discuss the new opportunities presented by this technique.
引用
收藏
页码:803 / 810
页数:8
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