Small-angle X-ray scattering of extended defects in diamonds

被引:7
|
作者
Shiryaev, A
Dembo, K
Klyuev, Y
Naletov, A
Feigelson, B
机构
[1] RAS, Inst Crystallog, Moscow 117901, Russia
[2] VNIIAImaz, Moscow, Russia
[3] Basis, Moscow, Russia
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2003年 / 36卷 / 01期
关键词
small-angle X-ray scattering; diamond; annealing; extended defects;
D O I
10.1107/S0021889803000530
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Results of the small-angle X-ray scattering (SAXS) of diamonds with different concentrations and types of optically-active defects are reviewed. It is shown that nitrogen-free (IIA) diamonds and diamonds with a low degree of nitrogen aggregation have no SAXS. Annealing of diamonds leads to the formation of three-dimensional clusters of defects with sizes in the range from similar to8 to 60 nm. There is no correlation between nitrogen concentration and the existence or the size of the clusters, however, the clusters are related to the degree of diamond annealing. The presence of the clusters is unrelated to 'platelets' and they contain little, if any, nitrogen. With annealing, the size of the clusters decreases and the contrast of electronic density with the matrix increases.
引用
收藏
页码:420 / 424
页数:5
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