Accelerated reliability fatigue life tests

被引：0
|
作者：
Jawaid, S [1 ]
Ferguson, J [1 ]
机构：
[1] Quantum Corp, Milpitas, CA 95035 USA
来源：
ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM - 2000 PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/RAMS.2000.816314
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页码：239 / 244
页数：6
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