XPEEM study of liquid Au-Si droplets on Si(111) near to the eutectic point

被引：6
|
作者：
Ressel, B
Heun, S
Schmidt, T
Prince, KC
机构：
[1] Sincrotrone Trieste, I-34012 Basovizza, TS, Italy
[2] Univ Wurzburg, BESSY 2, D-97074 Wurzburg, Germany
来源：
DEFECTS AND DIFFUSION IN SEMICONDUCTORS | 2000年 / 183-1卷
关键词：
spectromicroscopy; synchrotron radiation; photoelectron spectroscopy; gold; silicon; liquid phase;
D O I：
10.4028/www.scientific.net/DDF.183-185.181
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have analyzed the surface of liquid Au-Si eutectic droplets with photoemission spectromicroscopy. The Si 2p core level of the droplets shifts 0.2 eV to lower kinetic energy with respect to the surrounding Au/Si(111)-6x6 phase. The integral intensity of the Si 2p peak is approximately equal on the liquid droplet and on the surrounding substrate indicating that the local Au/Si stoichiometry does not change. Since bulk Au-Si liquid is Au-rich, this indicates that the liquid surface has a higher Si content than the bulk. An additional shoulder in the Si 2p spectrum of the droplet develops at 1.3 eV lower kinetic energy.
引用
收藏
页码：181 / 187
页数：7
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