New statistical theory of electrical discharge and breakdown in solid

The Weibull distribution is most often used to model the lifetimes in stress aging tests, but it in some way is a macroscopic empirical statistical model, and it does not consider the microscopic dynamic process. In this paper a cumulative stochastic dynamic model is presented, based on the concept of discharging. By solving this model the breakdown probability is derived and the results are consistent with the empirical formula.