Fabrication of metallic nanostructures by atomic force microscopy nanomachining and lift-off process

被引:26
|
作者
Hsu, JH [1 ]
Lin, CY [1 ]
Lin, HN [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
来源
关键词
D O I
10.1116/1.1815314
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the fabrication of metallic nanostructures by atomic force microscopy nanomachining on a thin resist and subsequent metal coating and lift-off. Nanodots with a size of 70 nm, nanowires with a width of 120 rim, and nanoelectrodes with a gap of 50 nm have been successfully created. Theoretical estimates of the minimum force for a satisfactory lift-off are also given and found to be consistent with the experimental value. The present work demonstrates the feasibility and effectiveness of using a single-layer resist in comparison with a two-layer resist. (C) 2004 American Vacuum Society.
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页码:2768 / 2771
页数:4
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