Identification and molecular mapping of genes for all-stage and high-temperature adult-plant resistance to stripe rust in 'Express' wheat

被引：0
|
作者：
Chen, X.
Lin, F.
机构：
[1] Washington State Univ, USDA ARS, Pullman, WA 99164 USA
[2] Washington State Univ, Pullman, WA 99164 USA
来源：
PHYTOPATHOLOGY | 2007年 / 97卷 / 07期
关键词：
D O I：
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中图分类号：
Q94 [植物学];
学科分类号：
071001 ;
摘要：
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页码：S21 / S21
页数：1
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