Morphology, structural and optical study of ZnS thin films prepared by Successive Ionic Layer Adsorption and Reaction (SILAR) Method

被引：0
|
作者：
Djelloul, A. [1 ]
Adnane, M. [1 ]
Larbah, Y. [1 ]
Hamzaoui, S. [1 ]
机构：
[1] Univ Sci & Technol Oran, Lab Electron Microscopy & Mat Sci, BP 1505, El Mnaouer Oran 31000, Algeria
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2016年 / 18卷 / 1-2期
关键词：
ZnS; SILAR; XRD; EDAX; SEM; UV; CHEMICAL BATH DEPOSITION; NANOCRYSTALLINE ZNS; SOLAR-CELLS; SOLUTION GROWTH; BUFFER LAYERS; PH; EPILAYERS;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Zinc Sulphide (ZnS) thin films are deposited on glass substrate by relatively simple, quick and cost effective successive ionic layer adsorption and reaction (SILAR) method at room temperature (27 degrees C). For ZnS thin film growth the parameters including concentrations of cationic and ionic precursors, number of immersion cycle, immersion time and pH of the solution are optimized. A further study has been made for structural, surface morphological and optical properties of the film using X-ray diffraction (XRD), EDAX, scanning electron microscopy (SEM), and optical absorption method (UV). The as deposited ZnS thin film exhibited hexagonal phase with optical band gap (Eg) of 3.93 eV. SEM image confirmed that film of smooth surface morphology.
引用
收藏
页码：136 / 141
页数：6
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