Interfacial Solute Segregation in the Thermally Grown Oxide of Thermal Barrier Coating Structures

被引：15
|
作者：
Chen, Yimeng [1 ]
Reed, Roger C. [2 ]
Marquis, Emmanuelle A. [1 ]
机构：
[1] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
[2] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
OXIDATION OF METALS | 2014年 / 82卷 / 5-6期
基金：
美国国家科学基金会;
关键词：
Thermal barrier coating; Segregation; Atom probe tomography; Grain boundary; Dislocations; SINGLE-CRYSTAL SUPERALLOYS; ALUMINA GRAIN-BOUNDARY; SPECIMEN PREPARATION; SCALE ADHESION; AL2O3; SYSTEMS; RESISTANCE; CHEMISTRY; SUBSTRATE; CREEP;
D O I：
10.1007/s11085-014-9502-7
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
Atom probe tomography is used to measure interfacial and grain boundary segregation in the thermally grown oxide layers found on thermal barrier coatings formed by isothermal heat treatments at 1,100 A degrees C. Segregation of Zr, Hf, Y, and minor elements at the metal/oxide interfaces, oxide grain boundaries and oxide dislocations are observed, quantified and rationalised. The implications of the findings are discussed.
引用
收藏
页码：457 / 467
页数：11
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