An Updated Bibliography of Accelerated Test Plans

被引：0
|
作者：
Nelson, Wayne B. [1 ]
机构：
[1] GE Co, Fairfield, CT 06825 USA
来源：
2015 61ST ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS 2015) | 2015年
关键词：
Accelerated testing; test plans; overstress; life; degradation; extrapolation; regression models; minimum variance; STEP-STRESS PLAN; LIFE-TESTS; OPTIMAL-DESIGN; WEIBULL DISTRIBUTION; EXPONENTIAL-DISTRIBUTION; BAYESIAN DESIGN; RAMP-TESTS; EXTRAPOLATION; OPTIMIZATION; PREDICTION;
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页数：6
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