Reliability sampling plans for lognormal distribution, based on progressively-censored samples

被引：69
|
作者：
Balasooriya, U [1 ]
Balakrishnan, N
机构：
[1] Natl Univ Singapore, Dept Stat & Appl Probabil, Singapore 119260, Singapore
[2] McMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, Canada
来源：
IEEE TRANSACTIONS ON RELIABILITY | 2000年 / 49卷 / 02期
基金：
加拿大自然科学与工程研究理事会;
关键词：
acceptance sampling; approximate moment of order statistic; best linear unbiased estimation; lognormal distribution; order statistic; s-normal distribution; type II progressive censoring;
D O I：
10.1109/24.877338
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents reliability sampling plans for the lognormal distribution based on progressively censored samples. In constructing these sampling plans, large-sample approximations to the best linear unbiased estimators of the location & scale parameters are used. For some selected progressive censoring schemes, reliability sampling plans are tabulated for p(alpha) and p(beta) to match MIL-STD-105, While in general, variable-sampling plans require smaller sample size when compared with attribute-sampling plans, the ordinary complete and right-censored life test experiments are special cases of the progressively censored experiment, Hence, the progressively censored reliability sampling plans in this paper are widely applicable, General application of the procedure is discussed, and two examples are provided.
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页码：199 / 203
页数：5
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