Analysis of multicrystalline silicon solar cells by modified 3-diode equivalent circuit model taking leakage current through periphery into consideration

被引:208
|
作者
Nishioka, Kensuke
Sakitani, Nobuhiro
Uraoka, Yukiharu
Fuyuki, Takashi
机构
[1] Japan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
[2] Nara Inst Sci & Technol, Grad Sch Mat Sci, Nara 6300101, Japan
关键词
solar cell; equivalent circuit; multicrystalline silicon; leakage current; temperature;
D O I
10.1016/j.solmat.2007.04.009
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We proposed a modified 3-diode equivalent circuit model for analysis of multicrystalline silicon (Mc-Si) solar cells. By using this equivalent circuit model, we can precisely evaluate the characteristics of Mc-Si solar cells taking the influence of grain boundaries and large leakage current through the peripheries into consideration and extract electrical properties. The calculated value of current-voltage characteristics for small size (3 mm x 3 mm) Mc-Si solar cells using this model completely agreed with the measured value at various cell temperatures. Moreover, the calculated open-circuit voltage (V-oc ) obtained by extracted parameters and measured V-oc agreed well. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:1222 / 1227
页数:6
相关论文
共 11 条
  • [1] Evaluation of Organic Thin Film Solar Cells Using 3-Diode Equivalent Circuit Model with Inverted Diode
    Sakurada, Yuya
    Ota, Yasuyuki
    Watanabe, Hiroki
    Murata, Hideyuki
    Nishioka, Kensuke
    [J]. DEFECTS-RECOGNITION, IMAGING AND PHYSICS IN SEMICONDUCTORS XIV, 2012, 725 : 179 - +
  • [2] New two-diode model for detailed analysis of multicrystalline silicon solar cells
    Kurobe, K
    Matsunami, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (12): : 8314 - 8321
  • [3] Analysis of each branch current of serial solar cells by using an equivalent circuit model
    易施光
    张万辉
    艾斌
    宋经纬
    沈辉
    [J]. Chinese Physics B, 2014, (02) : 601 - 607
  • [4] Analysis of each branch current of serial solar cells by using an equivalent circuit model
    Yi Shi-Guang
    Zhang Wan-Hui
    Ai Bin
    Song Jing-Wei
    Shen Hui
    [J]. CHINESE PHYSICS B, 2014, 23 (02)
  • [5] Analysis of the Temperature Characteristics in Polycrystalline Si Solar Cells Using Modified Equivalent Circuit Model
    Nishioka, Kensuke
    Sakitani, Nobuhiro
    Kurobe, Ken-Ichi
    Yamamoto, Yukie
    Ishikawa, Yasuaki
    Uraoka, Yukiharu
    Fuyuki, Takashi
    [J]. 1600, Japan Society of Applied Physics (42):
  • [6] Analysis of the temperature characteristics in polycrystalline Si solar cells using modified equivalent circuit model
    Nishioka, K
    Sakitani, N
    Kurobe, K
    Yamamoto, Y
    Ishikawa, Y
    Uraoka, Y
    Fuyuki, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (12): : 7175 - 7179
  • [7] Displacement damage analysis and modified electrical equivalent circuit for electron and photon-irradiated silicon solar cells
    Arjhangmehr, Afshin
    Feghhi, Seyed Amir Hossein
    [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2014, 169 (10): : 874 - 884
  • [8] Analysis of multi-crystalline silicon solar cells at low illumination levels using a modified two-diode model
    Kassis, A.
    Saad, M.
    [J]. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, 94 (12) : 2108 - 2112
  • [9] One-Diode Model Equivalent Circuit Analysis for ZnO Nanorod-Based Dye-Sensitized Solar Cells: Effects of Annealing and Active Area
    Kyaw, Htet Htet
    Bora, Tanujjal
    Dutta, Joydeep
    [J]. IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2012, 11 (04) : 763 - 768
  • [10] Efficiency-loss analysis of monolithic perovskite/silicon tandem solar cells by identifying the patterns of a dual two-diode model's current-voltage curves
    Zeng, Yuheng
    Ding, Zetao
    Liu, Zunke
    Liu, Wei
    Liao, Mingdun
    Yang, Xi
    Ying, Zhiqin
    Sun, Jingsong
    Sheng, Jiang
    Yan, Baojie
    He, Haiyan
    Shou, Chunhui
    Yang, Zhenhai
    Ye, Jichun
    [J]. JOURNAL OF SEMICONDUCTORS, 2023, 44 (08)