Infrared emission spectra of CaF2-CaO-SiO2 melt

被引：38
|
作者：
Ueda, S [1 ]
Koyo, H [1 ]
Ikeda, T [1 ]
Kariya, Y [1 ]
Maeda, M [1 ]
机构：
[1] Univ Tokyo, Inst Ind Sci, Minato Ku, Tokyo 1068558, Japan
来源：
ISIJ INTERNATIONAL | 2000年 / 40卷 / 08期
关键词：
FT-IR; hot filament technique; CaF2-CaO-SiO2; system; density functional theory;
D O I：
10.2355/isijinternational.40.739
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
The infrared emission spectra of CaF2-CaO-SiO2 melt were investigated by a method combining infrared emission spectroscopy and the hot-filament technique. Emission for spectra related to Si-O bond can be observed by this in situ technique. The influence of SiO2 and fluoride content on the spectrum was investigated, and the emission attributable to bonds corresponding to silicon-bridging oxygen and silicon-non bridging oxygen was discussed. Results suggest that fluoride ion dominantly substitutes for a non-bridging bond in low SiO2 concentration region. The structure of silicate was compared with calculated infrared emission of Si-F-O.
引用
收藏
页码：739 / 743
页数：5
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