Autocorrelated multivariate process;
Data mining algorithm;
One-class classification algorithm;
Statistical process control;
STATISTICAL PROCESS-CONTROL;
ARTIFICIAL NEURAL-NETWORKS;
QUALITY-CONTROL CHART;
MCUSUM CONTROL CHART;
PERFORMANCE;
RESIDUALS;
D O I:
10.1080/03610910903480826
中图分类号:
O21 [概率论与数理统计];
C8 [统计学];
学科分类号:
020208 ;
070103 ;
0714 ;
摘要:
In recent years, statistical process control (SPC) of multivariate and autocorrelated processes has received a great deal of attention. Modern manufacturing/service systems with more advanced technology and higher production rates can generate complex processes in which consecutive observations are dependent and each variable is correlated. These processes obviously violate the assumption of the independence of each observation that underlies traditional SPC and thus deteriorate the performance of its traditional tools. The popular way to address this issue is to monitor the residualsthe difference between the actual value and the fitted valuewith the traditional SPC approach. However, this residuals-based approach requires two steps: (1) finding the residuals; and (2) monitoring the process. Also, an accurate prediction model is necessary to obtain the uncorrelated residuals. Furthermore, these residuals are not the original values of the observations and consequently may have lost some useful information about the targeted process. The main purpose of this article is to examine the feasibility of using one-class classification-based control charts to handle multivariate and autocorrelated processes. The article uses simulated data to present an analysis and comparison of one-class classification-based control charts and the traditional Hotelling's T2 chart.
机构:
Univ Texas Arlington, Dept Ind & Mfg Syst Engn, Arlington, TX 76019 USAUniv Texas Arlington, Dept Ind & Mfg Syst Engn, Arlington, TX 76019 USA
Sukchotrat, Thuntee
Kim, Seoung Bum
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机构:
Univ Texas Arlington, Dept Ind & Mfg Syst Engn, Arlington, TX 76019 USAUniv Texas Arlington, Dept Ind & Mfg Syst Engn, Arlington, TX 76019 USA
Kim, Seoung Bum
Tsung, Fugee
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机构:
Hong Kong Univ Sci & Technol, Dept Ind Engn & Logist Management, Kowloon, Hong Kong, Peoples R ChinaUniv Texas Arlington, Dept Ind & Mfg Syst Engn, Arlington, TX 76019 USA
机构:
Penn State Univ, Lab Qual Engn & Syst Transit, Harold & Inge Marcus Dept Ind & Mfg Engn, University Pk, PA 16802 USAPenn State Univ, Lab Qual Engn & Syst Transit, Harold & Inge Marcus Dept Ind & Mfg Engn, University Pk, PA 16802 USA
Chen, Shuohui
Nembhard, Harriet Black
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Penn State Univ, Lab Qual Engn & Syst Transit, Harold & Inge Marcus Dept Ind & Mfg Engn, University Pk, PA 16802 USAPenn State Univ, Lab Qual Engn & Syst Transit, Harold & Inge Marcus Dept Ind & Mfg Engn, University Pk, PA 16802 USA