共 14 条
- [2] Brilliance scaling of discharge sources for extreme-ultraviolet and soft x-ray radiation for metrology applications [J]. JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2012, 11 (02):
- [3] EUV sources using Xe and Sn discharge plasmas [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (23) : 3254 - 3265
- [7] Multilayers for next generation EUVL at 6.Xnm [J]. EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE II, 2011, 8076
- [8] Modeling of EUV emission from xenon and tin plasma sources for nanolithography [J]. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER, 2006, 99 (1-3): : 482 - 492
- [9] Characterization and optimization of the laser-produced plasma EUV source at 13.5 nm based on a double-stream Xe/He gas puff target [J]. APPLIED PHYSICS B-LASERS AND OPTICS, 2010, 101 (04): : 773 - 789
- [10] Tao W, 2013, PLASMA SCI TECHNOL, V15, P435