Reliability Demonstration Test Model for Binomial System with Reliability Growth

被引:0
|
作者
Wu, Xiaoyue [1 ]
机构
[1] Natl Univ Def Technol, Coll Informat Syst & Management, Changsha, Hunan, Peoples R China
关键词
binomial system; demonstration test; discrete reliability growth model;
D O I
暂无
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Many complex engineering systems have reliability growth in successive test stages. In most existing reliability demonstration test models, reliability growth is not incorporated as modeling assumption. In this paper, for binomial system with 2 test stages, a reliability demonstration test model is presented that naturally takes possible reliability growth into consideration. Likelihood ratios are defined for various possible situations, and statistical. decision rules are derived. With a given example, the relative lower decision risk of the proposed model is illustrated by comparison with that of classical demonstration test model.
引用
收藏
页码:367 / 369
页数:3
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