Accurate On-Wafer Measurement Technique for E-Band MHMIC Communication Systems

被引：0
|
作者：
Ardakani, Mansoor Dashti [1 ]
Souzandeh, Nima [1 ]
Karimian, Reza [2 ]
Aissa, Sonia [1 ]
Tatu, Serioja O. [1 ]
机构：
[1] Univ Quebec, Inst Natl Rech Sci INRS EMT, Montreal, PQ, Canada
[2] George Washington Univ, Elect & Comp Engn Dept, Washington, DC USA
来源：
2021 UNITED STATES NATIONAL COMMITTEE OF URSI NATIONAL RADIO SCIENCE MEETING (USNC-URSI NRSM) | 2021年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The article has proposed a comprehensive analysis of on-wafer millimeter-wave measurements and addressed the challenges of calibration, measurements, and circuit characterization of E-band (60 to 90 GHz) circuits implemented on a thin ceramic substrate. The used thin ceramic substrate is suitable for miniaturized hybrid microwave integrated circuit fabrication at mm-wave frequencies. The proposed method is validated on a directional coupler, and a coupled-line bandpass filter in this frequency band. Simulation and experimental results are in great agreement at such high frequencies.
引用
收藏
页码：212 / 213
页数：2
相关论文
共 50 条
  • [1] Measurement and Analysis of FDM for E-Band Satellite Communication
    Haussmann, Simon
    Manoliu, Laura
    Gebert, Lukas
    Schoch, Benjamin
    Koller, Markus
    Meier, Jakob
    Steinmetz, Fabian
    Freese, Jens
    Henneberger, Ralf
    Tessmann, Axel
    Klinkner, Sabine
    Kallfass, Ingmar
    2023 53RD EUROPEAN MICROWAVE CONFERENCE, EUMC, 2023, : 356 - 359
  • [2] Development of a Verification Technique for On-wafer Noise Figure Measurement Systems
    Wu, Aihua
    Li, Chong
    Sun, Jing
    Wang, Yibang
    Liu, Chen
    2017 90TH ARFTG MICROWAVE MEASUREMENT SYMPOSIUM (ARFTG), 2017,
  • [3] An improved on-wafer noise measurement technique
    Beland, P
    Roy, L
    Labonte, S
    Stubbs, M
    WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 1998, : 596 - 600
  • [4] Improving Bandwidth Efficiency in E-Band Communication Systems
    Mehrpouyan, Hani
    Khanzadi, M. Reza
    Matthaiou, Michail
    Sayeed, Akbar M.
    Schober, Robert
    Hua, Yingbo
    IEEE COMMUNICATIONS MAGAZINE, 2014, 52 (03) : 121 - 128
  • [5] Fabrication Error Modeling and Analysis of an E-Band MHMIC Balanced Power Detector
    Harifi-Mood, Mehrdad
    Souzandeh, Nima
    Pourmohammadi, Peyman
    Hammou, Djilali
    Hosein, Bryan
    Aissa, Sonia
    Tatu, Serioja Ovidiu
    IEEE ACCESS, 2024, 12 : 17725 - 17734
  • [6] An E-band Cylindrical Reflector Antenna for Wireless Communication Systems
    Papageorgiou, Ioannis
    Derneryd, Anders
    Manholm, Lars
    Yang, Jian
    2013 7TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION (EUCAP), 2013, : 524 - 528
  • [7] Resonance technique for accurate on-wafer characterization of ferroelectric varactors
    Deleniv, A.
    Gevorgian, S.
    Sherman, V.
    Yamadaa, T.
    Setter, N.
    2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6, 2007, : 2054 - +
  • [8] An SOLR calibration for accurate measurement of orthogonal on-wafer DUTs
    Basu, S
    Hayden, L
    1997 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS I-III: HIGH FREQUENCIES IN HIGH PLACES, 1997, : 1335 - 1338
  • [9] Is E-Band Satellite Communication Viable?
    Harati, Parisa
    Schoch, Benjamin
    Tessmann, Axel
    Schwantuschke, Dirk
    Henneberger, Ralf
    Czekala, Harald
    Zwick, Thomas
    Kallfass, Ingmar
    IEEE MICROWAVE MAGAZINE, 2017, 18 (07) : 64 - 76
  • [10] Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency
    Sakamaki, Ryo
    Horibe, Masahiro
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2018, 67 (08) : 1940 - 1945
12345