Special issue on VLSI testing - Foreword

被引：0

|

作者：

Wu, CW ^{[1
]}

Lee, KJ ^{[1
]}

Lin, YL ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu, Taiwan

来源：

JOURNAL OF INFORMATION SCIENCE AND ENGINEERING | 2000年 / 16卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

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页码：U4 / U6

页数：3

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