Spectral domain approach to 2D-modelling of open planar structures with thick lossy conductors

被引:2
|
作者
Farina, M [1 ]
Rozzi, T [1 ]
机构
[1] Univ Ancona, Dipartimento Elettron & Automat, I-60131 Ancona, Italy
关键词
D O I
10.1049/ip-map:20000732
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Real planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices.
引用
收藏
页码:321 / 324
页数:4
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