A novel application of silicon microstrip technology for energy-dispersive EXAFS studies

被引：12

作者：

Iles, G

Dent, A

Derbyshire, G

Farrow, R

Hall, G

Noyes, G

Raymond, M

Salvini, G

Seller, P

Smith, M

Thomas, S

机构：

[1] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, London SW7 2BZ, England

[2] SERC, Daresbury Lab, CLRC, Warrington WA4 4AD, Cheshire, England

[3] Rutherford Appleton Lab, CLRC, Didcot OX11 0QX, Oxon, England

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2000年 / 7卷

关键词：

energy-dispersive EXAFS; EDE; silicon; microstrips; X-rays;

D O I：

10.1107/S0909049500005240

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A prototype X-ray detector for energy-dispersive EXAFS has been developed and tested to demonstrate the principle of using silicon microstrip detector technology for this application. Testing took place at the UK Synchrotron Radiation Source, where the absorption spectra of a 5 mu m Ni foil and a 25 mM NiCl2 solution were obtained.

引用

页码：221 / 228

页数：8

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