Coefficient-based test of parametric faults in analog circuits

被引：0
|
作者：
Guo, Z [1 ]
Savir, J [1 ]
机构：
[1] New Jersey Inst Technol, Dept Elect & Comp Engn, Newark, NJ 07102 USA
来源：
IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2 | 2003年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Coefficient-based test is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.
引用
收藏
页码：71 / 75
页数：5
相关论文
共 50 条
  • [1] Coefficient-based test of parametric faults in analog circuits
    Guo, Z
    Savir, J
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2006, 55 (01) : 150 - 157
  • [2] Improved Coefficient Based Test for Diagnosing Parametric Faults of Analog Circuits
    Kavithamani, A.
    Manikandan, V.
    Devarajan, N.
    Ramakrishnan, K.
    [J]. 2011 IEEE REGION 10 CONFERENCE TENCON 2011, 2011, : 64 - 68
  • [3] Test limitations of parametric faults in analog circuits
    Savir, J
    Guo, Z
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (05) : 1444 - 1454
  • [4] Test limitations of parametric faults in analog circuits
    Savir, J
    Guo, Z
    [J]. PROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02), 2002, : 39 - 44
  • [5] On the detectability of parametric faults in analog circuits
    Savir, J
    Zhen, G
    [J]. ICCD'2002: IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS, 2002, : 273 - 276
  • [6] A novel test generation approach for parametric faults in linear analog circuits
    Zheng, HH
    Balivada, A
    Abraham, JA
    [J]. 14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 470 - 475
  • [7] Test metrics for analog parametric faults
    Sunter, Stephen
    Nagi, Naveena
    [J]. Proceedings of the IEEE VLSI Test Symposium, 1999, : 226 - 234
  • [8] Test metrics for analog parametric faults
    Sunter, S
    Nagi, N
    [J]. 17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, : 226 - 234
  • [9] Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation
    Jaworski, Z
    Niewczas, M
    Kuzmicz, W
    [J]. 15TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1997, : 172 - 176
  • [10] Diagnosis of Parametric Faults in Linear Analog VLSI Circuits
    Thakur, Sandeep
    Satyanarayana, K. V. V.
    Reddy, K. Chinna Malla
    [J]. PROCEEDINGS OF THE 10TH INTERNATIONAL CONFERENCE ON INTELLIGENT SYSTEMS AND CONTROL (ISCO'16), 2016,
12345