Buffer layer morphology effects on the ordering of epitaxial FePd(001) thin films

被引：7
|
作者：
Caro, P
Cebollada, A
Ravelosona, D
Tamayo, J
Garcia, R
Briones, F
机构：
[1] CSIC, Ctr Nacl Microelect, IMM, E-28006 Madrid, Spain
[2] UAM, Madrid 28006, Spain
来源：
ACTA MATERIALIA | 1998年 / 46卷 / 07期
关键词：
D O I：
10.1016/S1359-6454(97)00385-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The structural properties of thin FePd(001) films grown on MgO(100) substrates by UHV triode-sputtering have been studied as a Function of the morphology of the substrate/seed layer interface. Changes in short range ordering are found to be correlated with the thickness of the Pt seed layer which controls the interface morphology and the formation of order domains in the FePd alloy along the growth direction. (C) 1998 Acta Metallurgica Inc.
引用
收藏
页码：2299 / 2303
页数：5
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