Security vs. test quality: Fully embedded test approaches are the key to having both

被引：0
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作者：
Pateras, S
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来源：
INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS | 2004年
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TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
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页码：1413 / 1413
页数：1
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