Fabrication of high-quality fiber micro-probe for near-field optical microscope by laser-assisted melting and pulling method

被引:2
|
作者
Xiang, SB [1 ]
Zhang, TH
Xiang, X
Wu, ZH
Zhang, CP
机构
[1] Zhengzhou Inst Light Ind, Dept Tech Phys, Zhengzhou 450002, Peoples R China
[2] Nankai Univ, Sch Phys, Tianjin 300071, Peoples R China
[3] Beijing Inst Technol, Res Ctr Mat Sci, Beijing 100081, Peoples R China
来源
OPTIK | 2004年 / 115卷 / 07期
关键词
fiber probe; fabrication; NSOM; laser-assisted method;
D O I
10.1078/0030-4026-00368
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The fiber micro-probe for near-field scanning optical niicroscope (NSOM) was fabricated using end-fixed laser-assisted melting and pulling method. The scanning electron microscope (SEM) observation showed that the fiber probes obtained by this method possessed small diameter of tip and large conic angle. The reproducibility came close to 70%. The effects of various fabrication parameters on probes were investigated. including laser power, pulling force, and the diameter of melting zone. The optimal processing conditions were derived based on the experiments and theoretical analysis. This research provides an alternative and advantageous method for fabrication of high-quality fiber probes.
引用
收藏
页码:301 / 304
页数:4
相关论文
共 50 条
  • [1] A photocantilever: an integrated micro-probe for near-field optical microscopy
    Fukuzawa, K
    Tanaka, Y
    Kuwano, H
    Yoshikawa, H
    Ohkubo, T
    Kato, T
    NEAR-FIELD OPTICS: PHYSICS, DEVICES, AND INFORMATION PROCESSING, 1999, 3791 : 21 - 31
  • [2] Development of optical fiber probe for the scanning near-field optical microscope
    Tsinghua Univ, Beijing, China
    Guangdian Gongcheng, 2 (25-29, 34):
  • [3] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A LASER TRAPPED PROBE
    KAWATA, S
    INOUYE, Y
    SUGIURA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (12A): : L1725 - L1727
  • [4] Laser acts as near-field scanning optical microscope probe
    Burgess, DS
    PHOTONICS SPECTRA, 2006, 40 (06) : 129 - 130
  • [6] Near-field modulation of laser diode emissions by an aperture probe of near-field optical microscope
    Tomioka, Akihiro
    Fujimoto, Atsushi
    Kinoshita, Shinji
    Susaki, Wataru
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2008, 40 (06): : 2201 - 2203
  • [7] Analysis and preparation of optical fiber probe in scanning near-field optical microscope
    Univ of Science and Technology of, China, Hefei, China
    Guangdian Gongcheng, 2 (20-24):
  • [8] FIBER LASER PROBE FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    BETZIG, E
    GRUBB, SG
    CHICHESTER, RJ
    DIGIOVANNI, DJ
    WEINER, JS
    APPLIED PHYSICS LETTERS, 1993, 63 (26) : 3550 - 3552
  • [9] Near-field modulation of AlGaInP laser diode emissions by an aperture probe of near-field optical microscope
    Kamiyama, Yasushi
    Tomioka, Akihiro
    Anzai, Takahiro
    Iwamoto, Kazuhisa
    Susaki, Wataru
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 1, 2009, 6 : S236 - S239
  • [10] An Aperture Probe of Near-Field Optical Microscope: Near-Field Tool to Modulate the Laser Diode Emissions
    Tomioka, Akihiro
    Anzai, Takahiro
    Iwamoto, Kazuhisa
    Kamiyama, Yasushi
    Susaki, Wataru
    E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2009, 7 : 757 - 759