Shear strength of Sn-3.5Ag solder and Sn-3.5Ag/Cu joint

被引:0
|
作者
Luo, Zhongbing [1 ]
Wang, Lai [1 ]
Gao, Yanjun [1 ]
Zhao, Jie [1 ]
机构
[1] Dalian Univ Technol, Sch Mat Sci & Engn, Dalian 116024, Peoples R China
关键词
Sn-3.5Ag; Sn-3.5Ag/Cu; Strain sensitivity; Shear; Fracture; STRAIN-RATE; SN-AG; TENSILE PROPERTIES; COOLING RATE; TEMPERATURE; ALLOYS; MICROSTRUCTURE; BEHAVIOR;
D O I
暂无
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
The multiscale microstructures and shear properties of Sn-3.5Ag at different cooling rates and Sn-3.5Ag/Cu joint have been studied. Results show that when the cooling rate decreased from 3.5K/s to 1.0K/s, short-needlelike bulk Ag3Sn intermetallic compounds (IMCs) formed and dispersed homogeneously in matrix. Simultaneously, eutectic region was refined. Linear increasing relationship on log-log plot was obtained between shear strength and shear strain rate for all samples. The shear strength of Sn-3.5Ag solder at fast cooling rate was higher than that at a slow cooling rate, but both were smaller than that of joint. The strain sensitivity exponent m for bulk solders at 1.0K/s, 3.5K/s and joint was 0.094, 0.076 and 0.082, respectively. Fractography analysis indicated all the solder samples, and Sn-3.5Ag/Cu joint at low strain rates (0.1rad/s and 1rad/s), exhibited ductile fracture no matter what cooling rate. At high strain rate (10rad/s), broken Cu6Sn5 were found in the fractography of Sn-3.5Ag/Cu joint. However, the main part of the fractography was still composed of dimples, which indicated mixed fracture happened.
引用
收藏
页码:511 / 515
页数:5
相关论文
共 50 条
  • [1] The effect of Cu addition to Sn-3.5Ag solder joint
    Choi, WK
    Jeong, SW
    Lee, HM
    [J]. PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II, 2001, : 1031 - 1034
  • [2] Effect of in addition on Sn-3.5Ag solder and joint with Cu substrate
    Choi, WK
    Yoon, SW
    Lee, HM
    [J]. MATERIALS TRANSACTIONS, 2001, 42 (05) : 783 - 789
  • [3] Effect of Ag on IMC Growth and Shear Strength of Sn-3.5Ag/Cu microbumps
    Guo, Fayao
    Ling, Huiqin
    Yin, Yihao
    Li, Ming
    Zhang, Wenqi
    Cao, Liqiang
    [J]. ICEPT2019: THE 2019 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, 2019,
  • [4] Characterisation of Sn-3.5Ag solder/Cu joint under various reflow conditions
    Georgy, K.
    Tikale, Sanjay
    Prabhu, K. Narayan
    [J]. MATERIALS SCIENCE AND TECHNOLOGY, 2022, 38 (08) : 458 - 468
  • [5] Microstructure and shear strength on ultrasonic-assisted soldered the Si/Cu joint using Sn-3.5Ag solder
    Ding, Zhijie
    Xue, Haitao
    Guo, Weibing
    Chen, Cuixin
    Jia, Yang
    [J]. MATERIALS TODAY COMMUNICATIONS, 2022, 33
  • [6] Microstructural Evolution of Sn-3.5Ag Solder with Lanthanum Addition
    Lee, Hwa-Teng
    Chen, Yin-Fa
    Hong, Ting-Fu
    Shih, Ku-Ta
    Hsu, Che-Wei
    [J]. 2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009), 2009, : 541 - +
  • [7] Effects of Co addition in eutectic Sn-3.5Ag solder on shear strength and microstructural development
    Lee, Jung-Sub
    Chu, Kun-Mo
    Patzelt, Rainer
    Manessis, Dionysios
    Ostmann, Andreas
    Jeon, Duk Young
    [J]. MICROELECTRONIC ENGINEERING, 2008, 85 (07) : 1577 - 1583
  • [8] The Effect of Graphene on the Intermetallic and Joint Strength of Sn-3.5Ag Lead-free Solder
    Mayappan, R.
    Salleh, A.
    Andas, J.
    [J]. 4TH INTERNATIONAL CONFERENCE ON THE ADVANCEMENT OF MATERIALS AND NANOTECHNOLOGY (ICAMN IV 2016), 2017, 1877
  • [9] Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag Solder/Cu joints
    Deng, X
    Sidhu, RS
    Johnson, P
    Chawla, N
    [J]. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2005, 36A (01): : 55 - 64
  • [10] Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag solder/Cu joints
    X. Deng
    R. S. Sidhu
    P. Johnson
    N. Chawla
    [J]. Metallurgical and Materials Transactions A, 2005, 36 : 55 - 64