Phases transformations in the Ni-Al system investigation by synchrotron radiation diffraction

被引：21

作者：

Sharafutdinov, M. R.

Korchagin, M. A.

Shkodich, N. F.

Tolochko, B. P.

Tsygankov, P. A.

Yagubova, I. Yu.

机构：

[1] SB RAS, Inst Solid State Chem, Novosibirsk, Russia

[2] RAS, Inst Struct Macrokinet, Chernogolovka, Russia

[3] Bauman Moscow State Tech Univ, Moscow, Russia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2007年 / 575卷 / 1-2期

关键词：

synchrotron radiation; solid state reaction; self-propagating synthesis; thin film;

D O I：

10.1016/j.nima.2007.01.046

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Phase's transformations during solid state reaction in the mechanically activated (MA) Ni/Al powders and thin films were investigated by time-resolved diffraction (TRXRD). MA samples with different initial composition and activation time were studied. It was found, that the first detected phase was NiAl3 eventhough initial compositions showed NiAl-peak presence. Further reaction came through some phase transformations and final product depends on initial stoichiometry. X-ray pattern obtained for solid state reaction in thin film also showed NiAl3, but followed by one more phase, assumed Ni2Al9. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：149 / 151

页数：3

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