Time Resolved Synchrotron Radiation X-Ray Topography Study of Surface Acoustic Waves Propagation.

被引：2

作者：

Capelle, Bernard ^{[1
]}

Epelboin, Yves ^{[1
]}

Detaint, Jacques ^{[1
]}

Soyer, Alain ^{[1
]}

Haertwig, Juergen ^{[2
]}

机构：

[1] Univ Paris 06, CNRS, UMR 7590, IMPMC, 140 Rue Lourmel, F-75015 Paris, France

[2] European Synchrotron Radiat Facil, Xray Opt Grp, F-38043 Grenoble, France

来源：

2009 JOINT MEETING OF THE EUROPEAN FREQUENCY AND TIME FORUM AND THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, VOLS 1 AND 2 | 2009年

关键词：

D O I：

10.1109/FREQ.2009.5168190

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The purpose of this contribution is to study several phenomena influencing the formation of X-rays diffraction images of SAW propagating on crystals so to be able to use them to obtain further information about the SAW. We consider particularly new contrasts appearing in white beam section topographs made with low or large amplitude SAW. The first ones can bring information about propagation at different depth and the second allows a measurement of the amplitude of the SAW.

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页码：299 / +

页数：2

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