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- [1] Direct measurement of diffuse double-layer forces at the semiconductor/electrolyte interface using an atomic force microscopeJournal of Physical Chemistry B, 1997, 101 (41): : 8298 - 8303Hu, K.Fan, F.-R.F.Bard, A.J.Hillier, A.C.
- [2] Direct measurement of diffuse double-layer forces at the semiconductor/electrolyte interface using an atomic force microscopeJOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (41): : 8298 - 8303Hu, KFan, FRFBard, AJHillier, AC
- [3] NANOMETER-SCALE LITHOGRAPHY USING THE ATOMIC FORCE MICROSCOPEAPPLIED PHYSICS LETTERS, 1992, 61 (19) : 2293 - 2295MAJUMDAR, AODEN, PICARREJO, JPNAGAHARA, LAGRAHAM, JJALEXANDER, J
- [4] Measurement of electrical double layer forces at the electrode-electrolyte interface using dynamic force distance controlBIOPHYSICAL JOURNAL, 2004, 86 (01) : 479A - 479AHirata, YYokoyama, HMizutani, F
- [5] Measurement of double-layer forces at the electrode/electrolyte interface using the atomic force microscope: Potential and anion dependent interactionsJOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (48): : 18808 - 18817Hillier, ACKim, SBard, AJ
- [6] Nanometer-scale probing of potential-dependent electrostatic forces, adhesion, and interfacial friction at the electrode/electrolyte interfaceLANGMUIR, 1999, 15 (03) : 891 - 899Campbell, SDHillier, AC
- [7] Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscopeWEAR, 2003, 254 (10) : 1050 - 1055Iwata, FYamaguchi, MSasaki, A
- [8] Nanometer-scale lithography of ultrathin films with atomic force microscopeJOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1998, 33 : S84 - S86Kim, JLee, HShin, YPark, S
- [10] Nanometer-scale manipulation and ultrasonic cutting using an atomic force microscope controlled by a haptic device as a human interfaceJAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (07) : 6181 - 6185Iwata, FutoshiOhara, KouheiIshizu, YuichiSasaki, AkiraAoyama, HisayukiUshiki, Tatsuo