Generalized continuum sensitivity formula for optimum design od electrode and dielectric contours

被引:8
|
作者
Kim, DH [1 ]
Park, IH
Shin, MC
Sykulski, JK
机构
[1] Univ Southampton, Dept Elect Engn, Southampton SO17 1BJ, Hants, England
[2] Sungkyunkwan Univ, Sch Elect & Comp Engn, Suwon 440746, South Korea
关键词
continuum approach; design optimization; electrostatics; sensitivity analysis;
D O I
10.1109/TMAG.2003.810213
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a generalized continuum sensitivity formula that is applicable to all cases of the optimization of electrostatic devices. Using the proposed approach, it is easy to deal with any design problems concerning electrode and dielectric contours to control space field distribution as well as surface field intensity. The derived sensitivity formula, in conjunction with the boundary-element method and the finite-element method, has been successfully applied to shape optimization of three representative examples in electrostatics.
引用
收藏
页码:1281 / 1284
页数:4
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