This paper presents a generalized continuum sensitivity formula that is applicable to all cases of the optimization of electrostatic devices. Using the proposed approach, it is easy to deal with any design problems concerning electrode and dielectric contours to control space field distribution as well as surface field intensity. The derived sensitivity formula, in conjunction with the boundary-element method and the finite-element method, has been successfully applied to shape optimization of three representative examples in electrostatics.
机构:
University of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United StatesUniversity of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United States
Choi, Nak-Sun
Jeung, Gi-Woo
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机构:
University of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United StatesUniversity of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United States
Jeung, Gi-Woo
Kim, Nam-Kyung
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机构:
University of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United StatesUniversity of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United States
Kim, Nam-Kyung
Byun, Jin-Kyu
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机构:
University of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United StatesUniversity of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United States
Byun, Jin-Kyu
Kim, Dong-Hun
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机构:
University of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United StatesUniversity of Illinois at Urbana-Champaign, ECE Post-doc Research Associate, United States
Kim, Dong-Hun
Transactions of the Korean Institute of Electrical Engineers,
2010,
59
(08):
: 1388
-
1393