GDOES depth profiling analysis of the air-formed oxide film on a sputter-deposited Type 304 stainless steel

被引：6

作者：

Shimizu, K

Habazaki, H

Skeldon, P

Thompson, GE

Wood, GC

机构：

[1] Univ Manchester, Inst Sci & Technol, Ctr Corros & Protect, Manchester M60 1QD, Lancs, England

[2] Keio Univ, Chem Lab, Yokohama, Kanagawa 2238251, Japan

[3] Hokkaido Univ, Grad Sch Engn, Sapporo, Hokkaido 0608628, Japan

[4] Univ Manchester, Inst Sci & Technol, Ctr Corros & Protect, Manchester M60 1QD, Lancs, England

来源：

SURFACE AND INTERFACE ANALYSIS | 2000年 / 29卷 / 11期

关键词：

glow discharge optical emission spectroscopy; GDOES; stainless steel; oxide films;

D O I：

10.1002/1096-9918(200011)29:11<743::AID-SIA921>3.0.CO;2-Q

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An air-formed film, similar to2 nm thick, on sputter-deposited Type 304 stainless steel has been analysed by glow discharge optical emission spectroscopy (GDOES) depth profiling. The distributions of iron, chromium, nickel and hydrogen in the film and alloy substrate have been revealed, with excellent depth resolution. The film consists of two distinct layers: an outer iron oxide layer and an inner oxide layer highly enriched with chromium oxide. Further, a thin nickel-enriched layer is evident in the alloy immediately beneath the oxide film. The implications of these findings for the structure and mechanism of growth of the film are discussed. Copyright (C) 2000 John Whey & Sons, Ltd.

引用

页码：743 / 746

页数：4

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