AC and DC Quantized Hall Array Resistance Standards

被引：0

作者：

Elmquist, Randolph E. ^{[1
]}

Kruskopf, Mattias ^{[1
,2
]}

Patel, Dinesh K. ^{[1
,3
]}

Hu, I-Fan ^{[1
,3
]}

Liu, Chieh-, I ^{[1
,4
]}

Rigosi, Albert F. ^{[1
]}

Panna, Alireza R. ^{[1
]}

Payagala, Shamith U. ^{[1
]}

Jarrett, Dean G. ^{[1
]}

机构：

[1] NIST, 100 Bur Dr,Stop 8171, Gaithersburg, MD 20899 USA

[2] Phys Tech Bundesanstalt, Dept Elect Quantum Metrol, D-38116 Braunschweig, Germany

[3] Natl Taiwan Univ, Grad Inst Appl Phys, Taipei 10617, Taiwan

[4] Univ Maryland, Dept Chem & Biochem, College Pk, MD 20742 USA

来源：

2020 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM) | 2020年

关键词：

electrical measurement standards; quantized Hall resistance; epitaxial graphene; Wheatstone bridge; DEVICES;

D O I：

10.1109/cpem49742.2020.9191854

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Quantized Hall array resistance standards (QHARS) span values from 100 Omega to 1 M Omega and demonstrate precision approaching that of single devices. This paper focuses on QHARS having values near 1 k Omega for increased sensitivity using room-temperature direct current comparator (DCC) bridges and digital impedance bridges. We introduce a dc QHARS design that uses the Wheatstone bridge principle as a precise test of the QHARS self-consistency for dc measurements. Branched contacts and superconducting interconnections help to reduce ac and dc loading and leakage errors with near-zero resistance at magnetic flux densities of 9 T.

引用

页数：2

共 50 条

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