Controlled manipulation of thiol-functionalised gold nanoparticles on Si (100) by Dynamic Force Microscopy

被引：1
|
作者：
Paolicelli, G. [1 ]
Mougin, K. [3 ]
Vanossi, A. [2 ]
Valeri, S. [2 ]
机构：
[1] INFM Natl Res Ctr S3, CNR, Via Campi 213-A, I-41100 Modena, Italy
[2] Univ Modena, INFM Natl Res Ctr, CNR, Dept Phys, I-41100 Modena, Italy
[3] ICSI UPR 9069, CNRS, F-68057 Mulhouse, France
来源：
PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY | 2008年 / 100卷
关键词：
D O I：
10.1088/1742-6596/100/5/052008
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Mechanical control of nanometer size objects and the dynamic behaviour at this length scale are subjects of growing interest. One promising approach to operate and perform quantitative measurements in this regime is to use dissipation processes in atomic force microscopy. We obtained a controlled manipulation of thiol-functionalised gold nanoparticles on silicon dioxide and a measurement of the energy depinning threshold as a function of nanoparticles characteristics by using the AFM microscope in a particular dynamic regime. Detailed procedure and preliminary results will be described in this contribution.
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页数：4
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