A simple 4-port parasitic de-embedding methodology for high-frequency characterization of SiGeHBTs

被引：0

作者：

Liang, QQ ^{[1
]}

Cressler, JD ^{[1
]}

Niu, GF ^{[1
]}

Lu, Y ^{[1
]}

Freeman, G ^{[1
]}

Ahgren, D ^{[1
]}

Malladi, RM ^{[1
]}

Newton, K ^{[1
]}

Harame, DL ^{[1
]}

机构：

[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

来源：

2003 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS | 2003年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new 4-port S-parameter de-embedding methodology is presented. This de-embedding technique considers distributed on-wafer parasitics in the millimeter wave band (f > 30 GHz). The procedure is based on simple analytical calculations and requires no equivalent circuit modeling or electromagnetic simulations. Using both EM theory and HP-ADS simulations, we show that this technique can be used to accurately extract the S-parameters to frequencies higher than 100 GHz for state-of-the-art SiGe HBTs with a maximum cutoff frequency of 180 GHz. This method is also valid for use in decoupling package parasitic.

引用

页码：357 / 360

页数：4

共 50 条

[1] A simple four-port parasitic deembedding methodology for high-frequency scattering parameter and noise characterization of SiGeHBTs
Liang, QQ
Cressler, JD
Niu, GF
Lu, Y
Freeman, G
Ahlgren, DC
Malladi, RM
Newton, K
Harame, DL
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (11) : 2165 - 2174
[2] Simplified Thru-Only 4-Port De-embedding Method
Fan, Chun-Yu
Wei, Muh-Dey
Negra, Renato
[J]. 2017 12TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC), 2017, : 101 - 104
[3] Unified parasitic de-embedding methodology of on-wafer multi-port device characterization
Cho, MH
Huang, GW
Chiu, CS
Chen, KM
[J]. 2005 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-4, 2005, : 1307 - 1310
[4] An improved on-chip 4-port parasitics de-embedding method with application to RF CMOS
Wei, Xiaoyun
Xia, Kejun
Niu, Guofu
Li, Ying
Sweeney, Susan L.
Liang, Qingqing
Wang, Xudong
Taylor, Stewart S.
[J]. 2007 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS, DIGEST OF PAPERS, 2007, : 24 - +
[5] A simple lumped port S-parameter de-embedding method for on-package-interconnect and packaging component high-frequency modeling
Chen, Zhaoqing
[J]. 2008 IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS, 2008, : 81 - 84
[6] Multi-port De-embedding Methodology based on Exponential Mapping
Ballicchia, Mauro
Turchetti, Claudio
Orcioni, Simone
[J]. 2014 44TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2014, : 1325 - 1328
[7] Multi-port De-embedding Methodology based on Exponential Mapping
Ballicchia, Mauro
Turchetti, Claudio
Orcioni, Simone
[J]. 2014 9TH EUROPEAN MICROWAVE INTEGRATED CIRCUIT CONFERENCE (EUMIC), 2014, : 381 - 384
[8] Multiport De-embedding Technique for Balanced Varactor High Frequency Characterization
Morandini, Y.
Debroucke, R.
Larchanche, J. F.
Jan, S.
Boret, S.
Gloria, D.
Pekarik, J.
[J]. 2009 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, 2009, : 886 - +
[9] The impact of noise parameter de-embedding on the high-frequency noise modeling of MOSFETs
Deen, MJ
Chen, CH
[J]. ICMTS 1999: PROCEEDINGS OF THE 1999 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, 1999, : 34 - 39
[10] The "Load-Thru" (LT) De-embedding Technique for the Measurements of mm-Wave Balanced 4-Port Devices
Deng, Zhiming
Niknejad, Ali M.
[J]. 2010 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS RFIC SYMPOSIUM, 2010, : 207 - 210

← 1 2 3 4 5 →