Reliability and power management of integrated systems

被引：0
|
作者：
Mihic, K [1 ]
Simunic, T [1 ]
De Micheli, G [1 ]
机构：
[1] Stanford Univ, CSL, Stanford, CA 94305 USA
来源：
PROCEEDINGS OF THE EUROMICRO SYSTEMS ON DIGITAL SYSTEM DESIGN | 2004年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A new approach for dynamic reliability and power management of Integrated Systems, such as Systems on Chips (SoCs) and Networks on Chips (NoCs) is presented. With aggressive transistor scaling, decreased voltage margins, and increased processor power and temperature, reliability assessment has become a significant issue in design. Our work combines for the first time dynamic power management with reliability models. The joint model is used to determine system level reliability as a function of failure rates, system configuration and power management policies, We show that the overall system reliability is strongly affected by reliability network topology and power management policy.
引用
收藏
页码：5 / 11
页数：7
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