Research and Application about General-Purpose Electronic System Test Platform

被引：0

作者：

Ma, Lan ^{[1
]}

Tian, Yu ^{[1
]}

Wang, Houjun ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, Sch Automat Engn, Chengdu 610054, Peoples R China

来源：

IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE ON TESTING AND DIAGNOSIS | 2009年

关键词：

automatic test system; general-purpose test platform; Test program sets;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper introduces the research and application about general-purpose electronic system test platform including hardware and software. The characteristics of general automatic test system are discussed,and a kind of method for constructing electronic system general-purpose test platform is presented,including system architecture,software design and handware design. Automatic test system or test program sets which is developed in this platform is well in general utility,opening and extending.

引用

页码：16 / 18

页数：3

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