Device Closure of Remnant Ventricular Septal Defect in Post MI

被引：0
|
作者：
Safi, Lucy Michelle [1 ]
Cha, Rido [1 ]
机构：
[1] Cooper Univ Hosp, Camden, NJ USA
来源：
JOURNAL OF THE AMERICAN COLLEGE OF CARDIOLOGY | 2016年 / 67卷 / 16期
关键词：
D O I：
10.1016/j.jacc.2016.03.466
中图分类号：
R5 [内科学];
学科分类号：
1002 ; 100201 ;
摘要：
C-246
引用
收藏
页码：S400 / S401
页数：3
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