A model-based approach to sequential fault diagnosis

被引：6
|
作者：
Pietersma, Jurryt
van Gemund, Arjan J. C.
Bos, Andre
机构：
[1] Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Delft
来源：
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2007年 / 10卷 / 02期
关键词：
D O I：
10.1109/MIM.2007.364961
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method based on the model-based diagnosis (MBD) paradigm is proposed as an approach to derive tests and test sequences for sequential fault diagnosis. Test sequencing is recast as an MBD problem by extending the model with the test setup. It is illustrated that the implementation of MBD and the proposed method to test sequencing is applicable in a representative industrial environment and leads to a reduction in test decision tree costs of up to 59%.
引用
收藏
页码：46 / 52
页数：7
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