point defect concentrations in surface layers of binary oxides (vol 329, pg 95, 2019)

被引：0

作者：

Riess, Ilan ^{[1
]}

机构：

[1] Technion IIT, Dept Phys, IL-3200003 Haifa, Israel

来源：

SOLID STATE IONICS | 2021年 / 362卷

关键词：

D O I：

10.1016/j.ssi.2021.115574

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页数：1

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