Thick films on alumina substrates for piezoelectric devices applications

被引：0
|
作者：
Le Dren, S [1 ]
Megriche, A [1 ]
Gonnard, P [1 ]
Troccaz, M [1 ]
机构：
[1] Inst Natl Sci Appl, Lab Genie Elect & Ferroelect, F-69621 Villeurbanne, France
来源：
FERROELECTRICS | 2000年 / 238卷 / 1-4期
关键词：
ferroelectric; thick film; sintering; PZT; Bismuth Titanate;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
PZT and Bismuth Titanate thick films on alumina substrate are prepared. Grain size, temperature and time dependence of sintering is studied. Influence of PbO excess and atmosphere on piezoelectric properties is reported. For Bismuth Titanate materials high temperature measurements and deposits on metallic substrate are carried out.
引用
收藏
页码：791 / 798
页数：8
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