Pressure effect on the formation of ferroelectric SrBi2Ta2O9 thin films

被引:2
|
作者
Song, KY
Lee, YK
Lee, KS
Yoon, YS
Chae, HK
Lee, WI [1 ]
机构
[1] Inha Univ, Dept Chem, Inchon 402751, South Korea
[2] Inha Univ, Dept Elect Mat & Device Engn, Inchon 402751, South Korea
[3] Hankuk Univ Foreign Studies, Dept Chem, Yongin 449791, South Korea
关键词
SBT(SrBi2Ta2O9); ferroelectric; thin film; pressure effect; set-gel process;
D O I
10.1143/JJAP.39.2791
中图分类号
O59 [应用物理学];
学科分类号
摘要
It has been found that the formation of a ferroelectric phase for the SrBi2Ta2O9, (SBT) thin films derived from sol-gel solution is dependent on the oxygen pressure during the heat-treatment process. Under an elevated oxygen pressure as high as 30 atm, the heat-treatment temperature inducing the ferroelectric SET phase can be lowered to 650 degrees C. Those films processed at 650 degrees C present satisfactory ferroelectric properties, that is, the remanent polarization (P-r) is 5.0 mu C/cm(2), and the coercive field (E-c) is 43 kV/cm with 5 V application.
引用
收藏
页码:2791 / 2792
页数:2
相关论文
共 50 条
  • [1] Pressure effect on the formation of ferroelectric SrBi2Ta2O9 thin films
    [J]. Song, Kang Yong, 2000, JJAP, Tokyo, Japan (39):
  • [2] Thermal behavior in ferroelectric SrBi2Ta2O9 thin films
    Onodera, A
    Yoshio, K
    Myint, CC
    Tanaka, M
    Hironaka, K
    Kojima, S
    [J]. FERROELECTRICS, 2000, 241 (1-4) : 159 - 166
  • [3] Formation and properties of SrBi2Ta2O9 thin films
    Nagata, M.
    Vijay, D.P.
    Zhang, X.
    Desu, S.B.
    [J]. Physica Status Solidi (A) Applied Research, 1996, 157 (01): : 75 - 82
  • [4] Formation and properties of SrBi2Ta2O9 thin films
    Nagata, M
    Vijay, DP
    Zhang, X
    Desu, SB
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1996, 157 (01): : 75 - 82
  • [5] Oriented growth of SrBi2Ta2O9 ferroelectric thin films
    Desu, SB
    Vijay, DP
    Zhang, X
    He, BP
    [J]. APPLIED PHYSICS LETTERS, 1996, 69 (12) : 1719 - 1721
  • [6] The effect of excess bismuth on the ferroelectric properties of SrBi2Ta2O9 thin films
    Tze-Chiun Chen
    Tingkai Li
    Xubai Zhang
    Seshu B. Desu
    [J]. Journal of Materials Research, 1997, 12 : 1569 - 1575
  • [7] The effect of excess bismuth on the ferroelectric properties of SrBi2Ta2O9 thin films
    Chen, TC
    Li, TK
    Zhang, XB
    Desu, SB
    [J]. JOURNAL OF MATERIALS RESEARCH, 1997, 12 (06) : 1569 - 1575
  • [8] Orientation dependent ferroelectric properties of SrBi2Ta2O9 ferroelectric thin films
    Moon, SE
    Back, SB
    Kwun, SI
    Song, TK
    Yoon, JG
    [J]. PROCEEDINGS OF THE 2001 12TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS I AND II, 2001, : 933 - 936
  • [9] α-Axis growth of ferroelectric SrBi2Ta2O9 thin films on silicon
    Miu, D
    Martinez, JC
    Wiehl, L
    Raitieri, R
    Adrian, H
    [J]. MATERIALS LETTERS, 2005, 59 (10) : 1243 - 1247
  • [10] Origin of imprint in ferroelectric CSD SrBi2Ta2O9 thin films
    Grossmann, M
    Lohse, O
    Bolten, D
    Waser, R
    Hartner, W
    Schindler, G
    Nagel, N
    Dehm, C
    [J]. FERROELECTRIC THIN FILMS VII, 1999, 541 : 269 - 274