Density measurement of samples under high pressure using synchrotron microtomography and diamond anvil cell techniques

Accurate mass density information is critical in high-pressure studies of materials. It is, however, very difficult to measure the mass densities of amorphous materials under high pressure with a diamond anvil cell (DAC). Employing tomography to measure mass density of amorphous samples under high pressure in a DAC has recently been reported. In reality, the tomography data of a sample in a DAC suffers from not only noise but also from the missing angle problem owing to the geometry of the DAC. An algorithm that can suppress noise and overcome the missing angle problem has been developed to obtain accurate mass density information from such ill-posed data. The validity of the proposed methods was supported with simulations. (C) 2010 International Union of Crystallography Printed in Singapore - all rights reserved