Self-affine fractal characterization of a TNT fracture surface

被引:0
|
作者
Meisel, LV [1 ]
Scanlon, RD [1 ]
Johnson, MA [1 ]
Lanzerotti, YD [1 ]
机构
[1] USA, TACOM, ARDEC, Benet Labs, Watervliet, NY 12189 USA
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A trinitrotoluene (TNT) fracture surface image is characterized in terms of a self-affine fractal structure. The fracture surface was produced by high acceleration in an ultracentrifuge when the TNT strength was exceeded. An atomic force microscope (AFM) captured the topography of a 4 micron square region on the fracture surface. The present analysis supports a self-affine description of the TNT fracture surface (wavelengths of 0.016 micron to 4.0 micron) and provides a new prespective on fracture processes in TNT. An essential step in self-affine fractal characterization of surfaces is the determination of reference surfaces. A self-affine fracture surface can be described in terms of a single-valued height function. In the TNT fracture surface, single-valued height functions, which describe surface texture can only be defined with respect to curved reference surfaces. By employing curved reference surfaces, we have demonstrated that self-affine fractal scaling can be used to characterize the TNT fracture surface. This provides important information that is not evident in the analysis of individual surface scans.
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页码:363 / 367
页数:5
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