Microscopic analysis of noise behavior in semiconductor devices by the cellular automaton method

被引：0
|
作者：
Rein, A [1 ]
Zandler, G [1 ]
Saraniti, M [1 ]
Lugli, P [1 ]
Vogl, P [1 ]
机构：
[1] TECH UNIV MUNICH,DEPT PHYS,D-85747 GARCHING,GERMANY
来源：
HOT CARRIERS IN SEMICONDUCTORS | 1996年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：497 / 500
页数：4
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